The Annual CIMS Meeting was hosted this year by Professor Greg Huey at Georgia Institute of Technology in Atlanta, GA. The meeting was attended by researchers from institutions and universities around the world.  Close to 50 scientists attended in person from May 8 through the 12th and an additional 178 scientists attended virtually for discussions on chemical ionization mass spectrometry topics which include instrument development, experimental and sampling methods, data analysis and best practices for the ToF-CIMS instrument.